Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
A | WELL | Raw | NO3 | 1040 | NITRATE | 3/14/1986 | 0.18 | MCL | 10 | MG/L | 0 | 3/14/1986 | -1897661 | 1986 | NO3-1040 | D | A | WELL | Raw | 1986-03-14 | ||||||||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 12/14/2000 | 0.91 | MCL | 10 | MG/L | 0 | 12/21/2000 | 2000123901 | 914 | ESL Grants Pass | 4500NO3D | 2000 | NO3-1040 | D | AA | WELL | Raw | 914 | ESL Grants Pass | 4500NO3D | 2000-12-14 | ||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 11/27/2001 | 1.1 | MCL | 10 | MG/L | 0 | 12/10/2001 | 001114901 | 914 | ESL Grants Pass | 4500NO3D | 2001 | NO3-1040 | D | AA | WELL | Raw | 914 | ESL Grants Pass | 4500NO3D | 2001-11-27 | ||
A | STANDARD ENTRY POINT | Treated | NO3 | 1040 | NITRATE | 12/10/1993 | 0.685 | MCL | 10 | MG/L | 0 | 3/28/1994 | 93-11262 | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1993 | NO3-1040 | D | A | STANDARD ENTRY POINT | Treated | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1993-12-10 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/15/1996 | 0.96 | MCL | 10 | MG/L | 0 | 7/31/1996 | 96-6505 | 28 | Neilson Research Corporation | 4500NO3D | 1996 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500NO3D | 1996-07-15 | ||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 8/8/1995 | ND | MCL | 10 | MG/L | 0.2 | 8/15/1995 | 95-7952 | 28 | Neilson Research Corporation | 4500D | 1995 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500D | 1995-08-08 | ||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 12/11/1998 | 0.6 | MCL | 10 | MG/L | 0 | 12/28/1998 | 98-14617 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-12-11 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 11/19/1999 | 0.86 | MCL | 10 | MG/L | 0.2 | 12/10/1999 | 9911440 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999-11-19 |
A | STANDARD ENTRY POINT | Treated | NO2 | 1041 | NITRITE | 12/10/1993 | ND | MCL | 1 | MG/L | 0.01 | 3/28/1994 | 93-11262 | 28 | Neilson Research Corporation | 354.1 | SPECTROPHOTOMETRIC, MANUAL | 1993 | NO2-1041 | N | A | STANDARD ENTRY POINT | Treated | 28 | Neilson Research Corporation | 354.1 | SPECTROPHOTOMETRIC, MANUAL | 1993-12-10 |
AA | WELL | Raw | NO2 | 1041 | NITRITE | 8/8/1995 | ND | MCL | 1 | MG/L | 0.01 | 8/15/1995 | 95-7952 | 28 | Neilson Research Corporation | 4500B | 1995 | NO2-1041 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500B | 1995-08-08 | ||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/15/1996 | 440 | 0 | 7/31/1996 | 96-6505 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996-07-15 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 12/11/1998 | 360 | 0 | 12/28/1998 | 98-14617 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998-12-11 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 11/19/1999 | 410 | 0.44 | 12/10/1999 | 9911440 | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999-11-19 | |||
A | WELL | Raw | WQ | 1925 | PH | 3/14/1986 | 7.58 | MCL | 8.5 | PH | 0 | 3/14/1986 | -1897660 | 1986 | WQ-1925 | D | A | WELL | Raw | 1986-03-14 | ||||||||
AA | WELL | Raw | WQ | 1925 | PH | 7/15/1996 | 7.58 | MCL | 8.5 | PH | 0 | 7/31/1996 | 96-6505 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996-07-15 |
AA | WELL | Raw | WQ | 1925 | PH | 12/11/1998 | 7.4 | MCL | 8.5 | PH | 0 | 12/28/1998 | 98-14617 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-12-11 |
AA | WELL | Raw | WQ | 1925 | PH | 11/19/1999 | 7.56 | MCL | 8.5 | PH | 0.1 | 12/10/1999 | 9911440 | 28 | Neilson Research Corporation | 4500HB | 1999 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 1999-11-19 |