Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL - WELL | Raw | NO3 | 1040 | NITRATE | 8/5/1994 | 2.45 | MCL | 10 | MG/L | 0 | 8/12/1994 | 94-7890 | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1994 | NO3-1040 | D | AA | WELL - WELL | Raw | 28 | Neilson Research Corporation | 353.3 | CADMIUM REDUCTION, MANUAL | 1994-08-05 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 12/10/1998 | 0.91 | MCL | 10 | MG/L | 0 | 12/21/1998 | 98-14528 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-12-10 |
AA | WELL - WELL | Raw | NO2 | 1041 | NITRITE | 8/5/1994 | ND | MCL | 1 | MG/L | 0.01 | 8/12/1994 | 94-7890 | 28 | Neilson Research Corporation | 354.1 | SPECTROPHOTOMETRIC, MANUAL | 1994 | NO2-1041 | N | AA | WELL - WELL | Raw | 28 | Neilson Research Corporation | 354.1 | SPECTROPHOTOMETRIC, MANUAL | 1994-08-05 |
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 12/10/1998 | 230 | 0 | 12/21/1998 | 98-14528 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998-12-10 | |||
AA | WELL | Raw | WQ | 1925 | PH | 12/10/1998 | 6.8 | ACL | 6.5 | PH | 0 | 12/21/1998 | 98-14528 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-12-10 |