Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/21/1997 | ND | MCL | 10 | MG/L | 0.2 | 8/1/1997 | 97-7422 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1997 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1997-07-21 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 5/23/1999 | ND | MCL | 10 | MG/L | 0.2 | 6/7/1999 | 990547201A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999-05-23 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 4/26/1994 | ND | MCL | 10 | MG/L | 0.2 | 5/9/1994 | 94-3919 | 28 | Neilson Research Corporation | WewWG/5880 | ION SELECTIVE ELECTRODE | 1994 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | WewWG/5880 | ION SELECTIVE ELECTRODE | 1994-04-26 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/25/2000 | ND | MCL | 10 | MG/L | 0.012 | 7/31/2000 | 000752301B | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000-07-25 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/19/1995 | 0.33 | MCL | 10 | MG/L | 0 | 8/2/1995 | 95-7097 | 28 | Neilson Research Corporation | 4500D | 1995 | NO3-1040 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500D | 1995-07-19 | ||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/11/1996 | ND | MCL | 10 | MG/L | 0.2 | 7/19/1996 | 96-6348 | 28 | Neilson Research Corporation | 4500NO3D | 1996 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500NO3D | 1996-07-11 | ||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 6/12/2001 | ND | MCL | 10 | MG/L | 0.012 | 6/22/2001 | 010623301A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001-06-12 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 4/17/1998 | ND | MCL | 10 | MG/L | 0.2 | 5/1/1998 | 98-3825 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-04-17 |
AA | WELL | Raw | NO2 | 1041 | NITRITE | 7/21/1997 | ND | MCL | 1 | MG/L | 0.05 | 8/1/1997 | 97-7422 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1997 | NO2-1041 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1997-07-21 |
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/21/1997 | 640 | 0 | 8/1/1997 | 97-7422 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1997 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1997-07-21 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 5/23/1999 | 600 | 0 | 6/7/1999 | 990547201A | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999-05-23 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/25/2000 | 400 | 0.44 | 7/31/2000 | 000752301B | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000-07-25 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/11/1996 | 600 | 0 | 7/19/1996 | 96-6348 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1996-07-11 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 4/17/1998 | 520 | 0 | 5/1/1998 | 98-3825 | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 120.1 | CONDUCTANCE @ 25C | 1998-04-17 | |||
AA | WELL | Raw | WQ | 1925 | PH | 7/21/1997 | 7.5 | ACL | 6.5 | PH | 0 | 8/1/1997 | 97-7422 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1997 | WQ-1925 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1997-07-21 |
AA | WELL | Raw | WQ | 1925 | PH | 5/23/1999 | 7.8 | ACL | 6.5 | PH | 0 | 6/7/1999 | 990547201A | 28 | Neilson Research Corporation | 4500HB | 1999 | WQ-1925 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 1999-05-23 | ||
AA | WELL | Raw | WQ | 1925 | PH | 7/25/2000 | 7.8 | ACL | 6.5 | PH | 0.1 | 7/31/2000 | 000752301B | 28 | Neilson Research Corporation | 4500HB | 2000 | WQ-1925 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 2000-07-25 | ||
AA | WELL | Raw | WQ | 1925 | PH | 7/11/1996 | 7.5 | ACL | 6.5 | PH | 0 | 7/19/1996 | 96-6348 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996 | WQ-1925 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1996-07-11 |
AA | WELL | Raw | WQ | 1925 | PH | 4/17/1998 | 7.8 | ACL | 6.5 | PH | 0 | 5/1/1998 | 98-3825 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | E | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-04-17 |