Facility ID | Facility Name | Source Type | Analyte Group | Analyte Code | Analyte Name | Sample Date |
Result | Analyte Level Type |
Current Analyte Level |
Analyte Level Units |
Detection Limit |
Received Date |
Sample ID | Lab ID | Lab Name | Analysis Method | Method Name | SelectYear | SelectAnalyte | SelectResult | SelectFacilityID | SelectFacilityName | SelectSourceType | SelectLabID | SelectLabName | SelectMethod | SelectMethodName | FilterSampleDate |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AA | WELL | Raw | IOC | 1045 | SELENIUM | 6/9/1998 | ND | MCL | 0.05 | MG/L | 0.002 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998 | IOC-1045 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998-06-09 |
AA | WELL | Raw | IOC | 1010 | BARIUM | 6/9/1998 | 0.189 | MCL | 2 | MG/L | 0.1 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 3111D | ATOMIC ABSORPTION DIRECT ASPIRATION | 1998 | IOC-1010 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 3111D | ATOMIC ABSORPTION DIRECT ASPIRATION | 1998-06-09 |
AA | WELL | Raw | IOC | 1020 | CHROMIUM | 6/9/1998 | ND | MCL | 0.1 | MG/L | 0.001 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998 | IOC-1020 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998-06-09 |
AA | WELL | Raw | IOC | 1024 | CYANIDE | 6/9/1998 | ND | MCL | 0.2 | MG/L | 0.02 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 4500CN-C | AMENABLE SPECTROPHOTOMETRIC | 1998 | IOC-1024 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500CN-C | AMENABLE SPECTROPHOTOMETRIC | 1998-06-09 |
AA | WELL | Raw | IOC | 1035 | MERCURY | 6/9/1998 | ND | MCL | 0.002 | MG/L | 0.0002 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 245.1 | MANUAL COLD VAPOR TECHNIQUE | 1998 | IOC-1035 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 245.1 | MANUAL COLD VAPOR TECHNIQUE | 1998-06-09 |
AA | WELL | Raw | IOC | 1036 | NICKEL | 6/9/1998 | 0.005 | 0.001 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998 | IOC-1036 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998-06-09 | |||
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/31/2001 | ND | MCL | 10 | MG/L | 0.012 | 8/13/2001 | 010766001A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2001-07-31 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 7/28/2000 | ND | MCL | 10 | MG/L | 0.012 | 8/7/2000 | 000761401A | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 2000-07-28 |
AA | WELL | Raw | NO3 | 1040 | NITRATE | 12/30/1999 | ND | MCL | 10 | MG/L | 0.2 | 1/1/2000 | 991260701B | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999 | NO3-1040 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1999-12-30 |
AA | WELL | Raw | NO2 | 1041 | NITRITE | 6/9/1998 | ND | MCL | 1 | MG/L | 0.05 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | NO2-1041 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-06-09 |
AA | WELL | Raw | IOC | 1055 | SULFATE | 6/9/1998 | 30 | MCL | 250 | MG/L | 0.5 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998 | IOC-1055 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 300 | COLORIMETRIC SPADNS, WITH DISTILLATION | 1998-06-09 |
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 6/9/1998 | 352 | 0 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1998 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1998-06-09 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 7/28/2000 | 550 | 0.44 | 8/7/2000 | 000761401A | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 2000-07-28 | |||
AA | WELL | Raw | WQ | 1064 | CONDUCTIVITY @ 25 C UMHOS/CM | 12/30/1999 | 210 | 0.44 | 1/1/2000 | 991260701B | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999 | WQ-1064 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 2510B | CONDUCTANCE @ 25C | 1999-12-30 | |||
AA | WELL | Raw | IOC | 1074 | ANTIMONY, TOTAL | 6/9/1998 | ND | MCL | 0.006 | MG/L | 0.003 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998 | IOC-1074 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998-06-09 |
AA | WELL | Raw | IOC | 1075 | BERYLLIUM, TOTAL | 6/9/1998 | ND | MCL | 0.004 | MG/L | 0.0002 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998 | IOC-1075 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998-06-09 |
AA | WELL | Raw | IOC | 1085 | THALLIUM, TOTAL | 6/9/1998 | ND | MCL | 0.002 | MG/L | 0.001 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998 | IOC-1085 | N | AA | WELL | Raw | 28 | Neilson Research Corporation | 200.9 | ATOMIC ABSORPTION, PLATFORM | 1998-06-09 |
AA | WELL | Raw | WQ | 1925 | PH | 6/9/1998 | 8.1 | MCL | 8.5 | PH | 0.01 | 6/12/1998 | 98-6014 | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 150.1 | ELECTROMETRIC-INDIVIDUAL MEASUREMENT | 1998-06-09 |
AA | WELL | Raw | WQ | 1925 | PH | 7/28/2000 | 7.9 | MCL | 8.5 | PH | 0.1 | 8/7/2000 | 000761401A | 28 | Neilson Research Corporation | 4500HB | 2000 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 2000-07-28 | ||
AA | WELL | Raw | WQ | 1925 | PH | 12/30/1999 | 7.49 | MCL | 8.5 | PH | 0.1 | 1/1/2000 | 991260701B | 28 | Neilson Research Corporation | 4500HB | 1999 | WQ-1925 | D | AA | WELL | Raw | 28 | Neilson Research Corporation | 4500HB | 1999-12-30 |